WLCSP Probe Head / Socket

The WLCSP probe head is a critical component used in the testing of wafer-level chip-scale packages. It serves as a vital interface between WLCSP devices and automated test equipment (ATE). Its primary function during chip manufacturing testing is to establish electrical connections with WLCSP devices, enabling functional tests, parameter measurements, and other assessments to ensure the chips meet quality standards and performance requirements.