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2D MEMS Probe Card

MEMS probe cards are mainly used for testing advanced process wafers, with significant advantages such as small Pad/Bump pitch, multi-sites, and high pin count.

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Test Contact
Test Socket
Burn-in Test Socket
- Open Top
- Clamshell
MEMS Probe Card
- 2D MEMS Probe Card
Semiconductor Connector
Pogo Tower
Micro Stamping
Insert Molding
Micro Molding
Stiffener
Test Change Kit
- Change Kit
Test Jig
- Burn-in Jig

Features

• OD: 50um-150um

• Pitch: ≥ 45um

• High pin count: 40k+

• Kelvin test available

• Over rejection: ≤1%

• Tri-temp. test: -55°C~175°C

Purchase Consultation

Contact number

+86 0512-8717 6308

Contact Email

Sales@uigreen.com

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