Products-Suzhou UIGreen

Test Contact

A high-precision conductive component that connects testing equipment to chip lead (or pads) through physical contact, transmitting electrical signals between the tester (e.g., probe stations, test machines) and the chip to ensure accurate functional testing.

Test Socket

Test socket is a key interface component connecting the chip under test (DUT) and the testing system. It enables precise testing of the chip's functions and performance by providing stable mechanical contact and electrical connection. Its core role is to complete signal transmission, power supply, and data exchange without damaging the chip.

Burn-in Test Socket

Burn-in socket is a specialized device used for aging tests, which can effectively simulate complex environmental conditions to replicate the aging effects that chips would experience during actual use.

MEMS Probe Card

Probe cards are used for wafer electrical parameter testing, and their selection and maintenance directly affect testing efficiency and reliability.

Semiconductor Connector

Semiconductor connector is a key component applied in semiconductor devices and related electronic systems, mainly used to achieve electrical connections between circuits, signal transmission, and mechanical fixation between devices. It has a wide range of applications and plays an important role in different scenarios.

Pogo Tower

1. Mainly used in the CP testing process, connecting the motherboard of the Tester and the Probe Card;

2. Contains precisely arranged spring probes with excellent mechanical and electronic characteristics;

Micro Stamping

It is a product made from metal raw materials through micro-stamping technology or other composite technologies. It is an important electronic component, mainly serving to protect and fix the internal electronic parts.